4027011 – Electron microscopy I

The lecture Electron Microscopy I covers the physical principles of Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM). Detailed references to the application of these techniques in solid-state and materials research are provided to illustrate the capabilities and limitations of these techniques. Topics include: Analogies between Light Microscopy and TEM, the functioning of Transmission Electron Microscopes and sample preparation, interaction between electrons and solids (kinematic and dynamic electron diffraction in solids), high-resolution (S)TEM with atomic resolution, (S)TEM contrast generation with numerous application examples from materials and solid-state physics.