4027021 – Electron Microscopy II

The course will cover the principals of image formation in scanning electron microscopy (SEM) and scanning ion microscopy (FIB), nanostructuring with focused ion beams, and analytical methods in electron microscopy (chemical analysis, electronic properties). The aim is for you to understand these different aspects and be able to explain them yourself. Using application examples from materials science and solid-state physics, you will recognize the potential applications and limitations of the methods. After this lecture, you should be able to assess which method(s) is (are) suitable for specific questions in micro- and nanocharacterization.